Lock-In Thermography: Basics and Use for Evaluating Electronic Devices and Materials

By Martin C. Schubert, Martin Langenkamp, Otwin Breitenstein, et al.

Book Overview

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

• Format: Hardcover
• Language: English
• ISBN: 3319998242
• ISBN13: 9783319998244
• Release Date: January 2019
• Publisher: Springer
• Length: 321 Pages
• Weight: 1.45 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"