Leakage Current and Defect Characterization of Short Channel Mosfets

By Guntrade Roll

The continuous improvement in semiconductor technology requires field effect transistor scaling while maintaining acceptable leakage currents. This study analyzes the effect of scaling on the leakage... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3832532617
• ISBN13: 9783832532611
• Release Date: November 2012
• Publisher: Logos Verlag Berlin
• Length: 235 Pages
• Weight: 0.55 lbs.
• Dimensions: 0.5" x 5.7" x 8.0"