Laser Voltage Probing for Electronic Devices

By Ulrike Kindereit

The ongoing integration density increase changes the demands on failure analysis methods for ICs drastically. "Laser Voltage Probing" (LVP) is an all-optical laser-based technique that acquires... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3838110595
• ISBN13: 9783838110592
• Release Date: January 2012
• Publisher: Sudwestdeutscher Verlag Fur Hochschulschrifte
• Length: 176 Pages
• Weight: 0.59 lbs.
• Dimensions: 0.4" x 6.0" x 9.0"