Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Book Overview

Presents the applications of Kelvin probe force microscopy in nanotechnology

Provides an in-depth description of a variety of theoretical and experimental aspects of the technique

Includes contributions by the leading experts in the field

• Format: Paperback
• Language: English
• ISBN: 3030092984
• ISBN13: 9783030092986
• Release Date: January 2019
• Publisher: Springer
• Length: 521 Pages
• Weight: 1.67 lbs.
• Dimensions: 1.1" x 6.1" x 9.2"