Istfa 2006: International Symposium for Testing and Failure Analysis (Book and CD)

By Asm International Staff and International Symposium for Testing and Failure Analysis

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 0871708442
• ISBN13: 9780871708441
• Release Date: December 2006
• Publisher: A S M International
• Length: 552 Pages