Ion Beam Analysis: Fundamentals and Applications

By James W Mayer, Michael Nastasi, Yongqiang Wang, et al.

Book Overview

This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, R

• Format: Paperback
• Language: English
• ISBN: 0367445840
• ISBN13: 9780367445843
• Release Date: November 2019
• Publisher: CRC Press
• Length: 472 Pages
• Weight: 1.50 lbs.
• Dimensions: 1.0" x 6.1" x 9.1"