Internal Stress of Thin Film

By Tamjid Chowdhury

Stress is a very important parameter which determines the reliability and life-time of thin film. Over 60% rejection of the electronic devices is due to stress failure. Stress can play an important... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639303237
• ISBN13: 9783639303230
• Release Date: October 2010
• Publisher: VDM Verlag
• Length: 172 Pages
• Weight: 0.57 lbs.
• Dimensions: 0.4" x 6.0" x 9.0"