Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

by Michael G. Pecht, Lall, Edward B. Hakim, et al.

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective...

• Format: Hardcover
• Language: English
• ISBN: 0849394503
• ISBN13: 9780849394508
• Release Date: June 1997
• Publisher: CRC Press
• Length: 328 Pages
• Weight: 2.09 lbs.
• Dimensions: 0.8" x 7.3" x 10.3"