In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing: 19-21 May, 1999, Edinburgh, Scotland (Proceedings Europt Series)

By Gudrun Kissinger and Seshu V. Pabbisetty

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• Format: Paperback
• Language: English
• ISBN: 0819432237
• ISBN13: 9780819432230
• Release Date: April 1999
• Publisher: Society of Photo Optical
• Length: 344 Pages
• Weight: 1.80 lbs.
• Dimensions: 11.0" x 1.0" x 8.8"