Iddq Testing for CMOS VLSI

By Rochit Rajsuman and Dr Rochit Rajsuman

Provides coverage of IDDQ testing, including discussion of the correlation between physical defects and logical faults, and how IDDQ testing detects these defects. This title presents information on... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0890067260
• ISBN13: 9780890067260
• Release Date: October 1994
• Publisher: Artech House Publishers
• Length: 193 Pages
• Weight: 1.15 lbs.
• Dimensions: 0.7" x 6.2" x 9.3"