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High Resolution X-Ray Diffractometry and Topogr...
Edition Description
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for...
Edition Details
Format:Paperback
Language:English
ISBN:0367400634
Format: Paperback
Condition:
$
94.99
High Resolution X-Ray Diffractometry and Topogr...
Edition Description
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development,...
Edition Details
Format:Hardcover
Language:English
ISBN:0850667585
Format: Hardcover
Condition:
$
265.00
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