Hierarchical Modeling for VLSI Circuit Testing

by John P. Hayes and Debashish Bhattacharya

Book Overview

Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low,... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461288193
• ISBN13: 9781461288190
• Release Date: September 2011
• Publisher: Springer
• Length: 160 Pages
• Weight: 0.56 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"