Skip to content
Menu Button
Scan a barcode
Scan
My Lists
Menu Button
Scan a barcode
Scan
Sell your books for cash or store credit, and shipping is free!
Try ThriftBooks BuyBack →
Hf-Based High-K Dielectrics: Process Development, Performance Characterization, and Reliability
< Back to Title Page

All Formats & Editions

1 - 1 of 1 results found
Hf-Based High-K Dielectrics: Process Developmen... 3031014243 Book Cover

Hf-Based High-K Dielectrics: Process Developmen...

By
Edition Description

In this work, the reliability of HfO2 (hafnium oxide) with poly gate and dual metal gate electrode (Ru-Ta alloy, Ru) was investigated. Hard breakdown and soft breakdown, particularly the Weibull slopes, were studied under constant voltage stress. Dynamic stressing has also been...

Edition Details
Format:Paperback
Language:English
ISBN:3031014243
Format: Paperback
Condition:
$
34.70
50 Available
Trustpilot

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Follow Us

Link to Facebook
Link to Twitter
Link to Pinterest
Link to Tumblr
Link to Instagram
Copyright © 2026 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured