Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

by Patrick Echlin

Book Overview

Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0387857303
• ISBN13: 9780387857305
• Release Date: March 2009
• Publisher: Springer
• Length: 332 Pages
• Weight: 2.05 lbs.
• Dimensions: 1.0" x 7.3" x 10.1"