Growth and Characterization of Al(1-x)In(x)N Films and Nanostructures - Nitrides, Epitaxy, Selfassembly and Optoelectronics

By Yuriy Danylyuk

The book contains experimental information of pseudo-epitaxial growth a series of Al(1-x)In(x)N films with thicknesses ranging from 100 nm to 8000 nm and In concentration (x) ranging from 0 to 1 on... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639030281
• ISBN13: 9783639030280
• Release Date: September 2008
• Publisher: VDM Verlag Dr. Mueller E.K.
• Length: 124 Pages
• Weight: 0.39 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"