Fundamentals of Microstructural Characterization of Materials

By Navid Nasajpour Esfahani and Hamid Garmestani

Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching.

Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.

• Format: Paperback
• Language: English
• ISBN: 0443341893
• ISBN13: 9780443341892
• Release Date: November 2025
• Publisher: Elsevier
• Length: 518 Pages
• Weight: 1.90 lbs.
• Dimensions: 1.0" x 6.0" x 9.1"