From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

By Wojciech Maly and Jitendra B. Khare

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Softcover Repri

Format:Paperback

Language:English

ISBN:146128595X

ISBN13:9781461285953

Release Date:September 2011

Publisher:Springer

Length:166 Pages

Weight:0.55 lbs.

Dimensions:0.4" x 6.1" x 9.2"

Related Subjects

Computers Computers & Technology Electrical & Electronics Engineering Technology

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

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