Fringe 2009: 6th International Workshop on Advanced Optical Metrology

Key Note.- Holography in the #x0027;60s and #x0027;70s #x2013; A View from the Fringes.- Topic 1: New Methods and Tools for Data Acquisition.- Coherence Holography: A Thought on Synthesis and Analysis of Optical Coherence Fields.- The Polarization Approach in Measuring Correlation Properties of Optical Fields.- Real-time Coherence Holography.- Coherence and Correlation in Digital Holography.- Analysis of fringe formation and localization in optical interferometry using optical coherence.- Quantitative Phase Imaging in Microscopy.- Comparison and unification of speckle-based phase retrieval and holography with applications in phasefront alignment and recognition.- High Precision Object Phase Reconstruction with Modified Phase Retrieval.- Phase retrieval with an LCoS display: characterization and application.- Digital dynamic-fringe pattern processing without frequency carrier, using wideband phase-shifting algorithmsM.- Error-compensating phase-shifting Fizeau interferometry with a wavelength-tunable laser diode.- Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane.- Digital phase shifting holography and holographic interferometry.- Fourier-transform method with high accuracy by use of iterative technique narrowing the spectra of a fringe pattern.- Fringe pattern processing using a new adaptive and steereable asynchronous algorithm.- Synthetic Aperture Digital Holography.- A new application of the Delaunay triangulation: The processing of speckle interferometry signals.- Phase analysis of interference signal with optical Hilbert transform based on orthogonal linear polarization phase shifting.- Digital Fourier-transform processing for analysis of speckle photographs.- Wavefront evaluation in phase shifting interferometry based on recurrence fringe processing with 3D prediction.- White-light fringe analysis with low-cost CCD camera.- Design and assessment of Differential Phase-Shifting Algorithms by means of their Fourier representation.- A Nonlinear Technique for Automatic Twin-Image and Zero-Order Term Suppression in Digital Holographic Microscopy.- Modified two-step phase-shifting algorithm: analysis, demonstration, and application.- The Used of Reference Wave for Diagnostics of Phase Singularities.- New convolution algorithms for reconstructing extended objects encoded in digitally recorded holograms.- Reconstruction of noisy measured sharp edges at thin sheet metal components.- Reduction of speckles in digital holographic interferometry.- Normalization and denoising in a multi-source and multi-camera profilometric system.- Automated Phase Map Referencing Against Historic Phase Map Data.- Numerical multiplexing and de-multiplexing techniques for efficient storage and transmission of digital holographic information.- Fringe Pattern Normalization Using Bidimensional Empirical Mode Decomposition and the Hilbert Transform.- Complementary Filtering Approach to Enhance the Optical Reconstruction of Holograms from a Spatial Light Modulator.- Combination of Phase Stepping and Fringe Tracking to Evaluate Strain from Noisy DSPI Data.- Influence of filter operators on 3D coordinate calculation in fringe projection systems.- Polarization interferometry of singular structure of organic crystal polarization properties..- Zero order interferometry technique for measuring the Lyapunov#x2019;s maximal index in optical fields.- Orientation-selective spiral-phase contrast microscopy.- Topic 2: Application Enhanced Technologies.- Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures.- Limitations and Optimization of Low-coherence Interferometry for High Precision Microscopic Form Measurement.- Instantaneous Wavelength Detection by a Whole-Field k-space Method.- Limiting aspects in length measurements by interferometry.- Aspects of design and the characterization of a high resolution heterodyne displacement interferometer.- The femtosecond

• Format: Paperback
• Language: English
• ISBN: 3642431690
• ISBN13: 9783642431692
• Release Date: November 2014
• Publisher: Springer
• Length: 792 Pages
• Weight: 2.48 lbs.
• Dimensions: 1.6" x 6.1" x 9.2"