Focused Ion Beam Systems: Basics and Applications

Book Overview

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam -... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0521831997
• ISBN13: 9780521831994
• Release Date: October 2007
• Publisher: Cambridge University Press
• Length: 408 Pages
• Weight: 2.10 lbs.
• Dimensions: 0.9" x 7.2" x 9.8"