Extreme Statistics in Nanoscale Memory Design

by Amith Singhee

Book Overview

Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins...

• Format: Paperback
• Language: English
• ISBN: 1461426723
• ISBN13: 9781461426721
• Release Date: November 2012
• Publisher: Springer
• Length: 246 Pages
• Weight: 0.81 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"