Electrostatic Force Spectroscopy of Localized States

By AYKUTLU DANA

Nanotechnology continues to develop novel materials and devices that can potentially improve our daily life. Atomic force microscopy (AFM) has proven to be one of the most powerful characterization... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639238869
• ISBN13: 9783639238860
• Release Date: April 2010
• Publisher: VDM Verlag
• Length: 128 Pages
• Weight: 0.44 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"