This volume contains an updated description of the experimental methods currently used in both Scanning and Transmission Electron Microscopy as well as the principles of electron optics and an outline of the most recent instrumental developments.The authors introduce the fundamental principles at the basis of the different techniques, the approximation used in the development of the theories, their range of validity, while stressing how to get microstructural information relevant in Materials Science.
Format:Hardcover
Language:English
ISBN:981020924X
ISBN13:9789810209247
Release Date:January 1993
Publisher:World Scientific Publishing Company
Length:696 Pages
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Format: Hardcover
Condition: New
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