Electron Microscopy and Multiscale Modeling: Proceedings of the EMMM-2007 International Conference

By Sergei L. Dudarev and Laurence D. Marks

The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modelling from around the world to explore how to synergistically combine atomic scale characterisation... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0735405190
• ISBN13: 9780735405196
• Release Date: April 2008
• Publisher: American Institute of Physics
• Length: 300 Pages
• Weight: 1.27 lbs.
• Dimensions: 0.8" x 6.6" x 9.5"