Electron Microscopy (P/H)

By China) International Symposium on Electron Microscopy (1990 Peking

Contents: Achievement of Atomic Resolution TEM and its Application to Materials Science (H Hashimoto); Some Thoughts on Ultra-High Resolution (A V Crewe); Analytical and Quantitative Electron Microscopy: A Survey of Recent Progress (C Colliex); Recent Developments in Electron Energy-Loss Spectroscopy (O L Krivanek & M K Kundmann); Dislocation Geometries in Semiconductors and Semiconductor Heterostructures (D J H Cockayne & J Zou); CBED Study of Strain and Composition Modulation in Semiconductor Superlattices (K K Fung et al.); The Relationship of Atomic Structure with Tc and Microstructure with Jc in High Tc Superconductors (S L Wen); Electron Microscopic Evidences of Quasicrystals (K H Kuo); Recent Advances in Ion-Milling Techniques for TEM Specimen Preparation of Materials (R Alani); Electron Microscope Analysis of the Na, K-Ion Pump: Localization, Crystallization and 3-D Structure (A B Maunsbach et al.); Recent Development of Analytical Colour Fluorescence Electron Microscopy: Application to Biomedical and Industrial Fields (K Ogawa et al.); High Resolution Electron Microscopic Investigation of Intracellular Crystallization Processes at the Atomic Level in the Cultured Cell Model (Y S Lee & Y Y Chou); Problems and Techniques in Biological SEM (R F E Crang); The Recent Trend of Electron Microscopy in Japan - Instrumentation (S Maruse); Analytical Scanning Electron Microscope Combined with Scanning Tunneling Microscope for Solid Surface (T Ichinokawa); UHV Scanning Tunneling Microscopy (T Sakurai & T Hashizume);

• Format: Hardcover
• Language: English
• ISBN: 9810205317
• ISBN13: 9789810205317
• Release Date: March 1991
• Publisher: World Scientific Publishing Company
• Length: 492 Pages
• Weight: 2.33 lbs.
• Dimensions: 1.5" x 6.0" x 9.0"