Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos

by Ricardo Reis, Gracieli Posser, Sachin S Sapatnekar, et al.

Book Overview

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably...

• Format: Paperback
• Language: English
• ISBN: 331984041X
• ISBN13: 9783319840413
• Release Date: July 2018
• Publisher: Springer
• Length: 118 Pages
• Weight: 0.45 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"