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Electromigration in Thin Films and Electronic Devices: Materials and Reliability
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Electromigration in Thin Films and Electronic D... 0081016964 Book Cover

Electromigration in Thin Films and Electronic D...

Edition Description

Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. "Electromigration in Thin Films and Electronic Devices" provides an up-to-date review of key topics in this commercially...

Edition Details
Format:Paperback
Language:English
ISBN:0081016964
Format: Paperback
Condition:
$
287.21
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