Electrical Characterization of SiC using DLTS System

By Muhammad Rizwan Qayyum

Experiments were carried out on a high blocking voltage Schottky diode (>2KV) fabricated on an n-type 4H-polytype Silicon Carbide. The sample is low doped in low 10E14 (carrier concentration is... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 363930621X
• ISBN13: 9783639306217
• Release Date: November 2010
• Publisher: VDM Verlag
• Length: 72 Pages
• Weight: 0.26 lbs.
• Dimensions: 0.2" x 6.0" x 9.0"