

A new, low-frequency, rectangular waveguide-based electromagnetic material characterization technique is developed that will reduce the test sample size in two dimensions realizing up to 50 percent reduction in sample cross-sectional area. To achieve this, custom made, reduced...

A new, low-frequency, rectangular waveguide-based electromagnetic material characterization technique is developed that will reduce the test sample size in two dimensions realizing up to 50 percent reduction in sample cross-sectional area. To achieve this, custom made, reduced...