Digital Integrated Circuit Testing from a Quality Perspective

by Eugene R. Hnatek

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0442006438
• ISBN13: 9780442006433
• Release Date: August 1993
• Publisher: Springer
• Length: 180 Pages
• Weight: 1.05 lbs.
• Dimensions: 0.7" x 6.2" x 9.7"