Diffuse X-Ray Scattering and Models of Disorder

By Thomas Richard Welberry

Book Overview

Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystal structure determination (crystallography). The main aim in the book is to show how computer simulation of a model crystal provides a general
method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analyzed.

Part I gives a description of the experimental methods used to obtain diffuse scattering data. Part II describes a number of simple stochastic models of disorder, which allows various concepts to be established and enables simple examples to be generated to illustrate key principles. Part III
describes example studies of a wide variety of real materials. These examples not only document the development of computer simulation methods for investigating and analyzing disorder problems but also to provide a resource to help future researchers to recognize the kinds of effects that can occur
and to point the way to tackling new problems which are encountered.

• Format: Paperback
• Language: English
• ISBN: 0199583811
• ISBN13: 9780199583812
• Release Date: May 2010
• Publisher: Oxford University Press, USA
• Length: 280 Pages
• Weight: 1.05 lbs.
• Dimensions: 0.6" x 6.1" x 9.1"