Design for Manufacturability and Statistical Design: A Constructive Approach

By Duane Boning, Michael Orshansky, Sani Nassif

Book Overview

Sources of Variability.- Front End Variability.- Back End Variability.- Environmental Variability.- Variability Characterization and Analysis.- Test Structures For Variability.- Statistical Foundations Of Data Analysis And Modeling.- Design Techniques for Systematic Manufacturability Problems.- Lithography Enhancement Techniques.- Ensuring Interconnect Planarity.- Statistical Circuit Design.- Statistical Circuit Analysis.- Statistical Static Timing Analysis.- Leakage Variability And Joint Parametric Yield.- Parametric Yield Optimization.- Conclusions.

• Format: Paperback
• Language: English
• ISBN: 1441940448
• ISBN13: 9781441940445
• Release Date: November 2010
• Publisher: Springer
• Length: 316 Pages
• Weight: 1.03 lbs.
• Dimensions: 0.7" x 6.1" x 9.2"