Current Issues in Condensed Matter Spectroscopy (Current Issues in Solid State Science)

The theme of this volume, the third in a successful series, is condensed matter spectroscopy. It comprises details of recent developments in a range of different spectroscopies which have collectively increased understanding of solid state phenomena through probing condensed matter. The articles in this volume were originally published in Journal of Physics C: Solid State Physics and Journal of Physics: Condensed Matter and are collated in one volume to give researchers a wide-ranging view of current activities in their fields. A M Stoneham has written an Introduction which provides a background for the articles. The authors were given the opportunity to supply addenda to their articles, where very recent work has yielded advances worthy of comments, and references. The subjects covered are the spectroscopy of crystal defects (a compendium of defect nomenclature), implanted muon studies in condensed matter science, X-ray absorption spectroscopy (EXAFS and XANES) at surfaces, inelastic electron tunnelling spectroscopy and point-contact spectroscopy.

• Format: Paperback
• Language: English
• ISBN: 0852744749
• ISBN13: 9780852744741
• Release Date: January 1990
• Publisher: CRC Press
• Length: 682 Pages
• Weight: 1.11 lbs.
• Dimensions: 6.1" x 9.3"