Crystal structure determination in the scanning electron microscope

By Klemens Jantscher

Electron backscatter diffraction in a scanning electron microscope can on the one hand be used to identify different crystalline phases and on the other hand to determine the relative orientations of... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639464346
• ISBN13: 9783639464344
• Release Date: April 2013
• Publisher: AV Akademikerverlag
• Length: 104 Pages
• Weight: 0.36 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"