Contactless VLSI Measurement and Testing Techniques

By Selahattin Sayil

Book Overview

Provides a single-source reference on contactless probing approaches for VLSI testing and diagnostic measurement

Introduces readers to various optical contactless testing techniques, such as Electro-Optic Probing, Charge Density Probe, and Photo-emissive Probe

Discusses the applicability and adaptability of each technique, based on multilayer metallization, wafer level techniques, and invasiveness

Provides a comparison among various contactless testing techniques

Describes a variety of industrial applications of contactless VLSI testing

• Format: Paperback
• Language: English
• ISBN: 3319888196
• ISBN13: 9783319888194
• Release Date: September 2018
• Publisher: Springer
• Length: 93 Pages