CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155

To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1107408326
• ISBN13: 9781107408326
• Release Date: June 2014
• Publisher: Cambridge University Press
• Length: 194 Pages
• Weight: 0.59 lbs.
• Dimensions: 0.4" x 6.0" x 9.0"