CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications

To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 1605111287
• ISBN13: 9781605111285
• Release Date: November 2009
• Publisher: Cambridge University Press
• Length: 194 Pages
• Weight: 0.85 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"