Charge-Trapping Non-Volatile Memories: Volume 2--Emerging Materials and Structures

Book Overview

This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.

Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
Details new architectures and current modeling concepts for non-volatile memory devices;
Focuses on conduction through multi-layer gate dielectrics stacks.

• Format: Paperback
• Language: English
• ISBN: 3319839993
• ISBN13: 9783319839998
• Release Date: July 2018
• Publisher: Springer
• Length: 211 Pages
• Weight: 0.69 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"