Characterization of Semiconductor Materials, Volume 1: Principles and Methods Volume 1

By Gary E. McGuire

Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0815512007
• ISBN13: 9780815512004
• Release Date: January 1990
• Publisher: William Andrew
• Length: 342 Pages
• Weight: 1.63 lbs.
• Dimensions: 1.1" x 6.4" x 9.5"