Characterisation of metallic particle distributions by scanning near-field optical microscopy (SNOM) in simultaneous reflection and transmission mode

By Steven Kämmer

Unlike conventional optics, scanning near-field optical microscopy (SNOM) overcomesthe Rayleigh criterion and can therefore achieve better resolutions than conventionaloptical microscopes. This... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3656745803
• ISBN13: 9783656745808
• Release Date: October 2014
• Publisher: Grin Verlag
• Length: 48 Pages
• Weight: 0.16 lbs.
• Dimensions: 0.1" x 5.8" x 8.3"