Characterisation and Control of Defects in Semiconductors

An up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors. Written by an international team, and edited by a highly regarded researcher in the field, the book provides thorough coverage of a variety of characterisation techniques and suggests methods for controlling the defects and hence the properties of semiconductors.

• Format: Hardcover
• Language: English
• ISBN: 1785616552
• ISBN13: 9781785616556
• Release Date: December 2019
• Publisher: Institution of Engineering & Technology
• Length: 596 Pages
• Weight: 2.40 lbs.
• Dimensions: 1.3" x 6.4" x 9.4"