Built in Test for VLSI: Pseudorandom Techniques

By Paul H. Bardell, J. Savir, W. H. McAnney

Book Overview

This handbook provides ready access to all of the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. The main intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students alike. It opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, reviewing by comparison the principles of design for testability of more advanced digital technology. It then offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing; and various data compression methods, such as polynomial dividers and unique shift-register sequence generators with special applications.

• Format: Hardcover
• Language: English
• ISBN: 0471624632
• ISBN13: 9780471624639
• Release Date: October 1987
• Publisher: Wiley-Interscience
• Length: 368 Pages
• Weight: 1.60 lbs.
• Dimensions: 0.9" x 6.4" x 9.6"

Customer Reviews

Great Digital test book

This is a great book written from professionals in the materia. I personally took the class with Dr. Savir and he is not only a great professor but this book is well worth purchasing.

BEST TEST BOOK

This is the best test book I have read. It covers all aspects of BIST with emphasis on pseudorandom techniques. It does not cover as much about testing as "Digital System Testing and Testable Design" but it is well worth its price tag.