Built-in-Self-Test and Digital Self-Calibration for RF SoCs

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Built-In-Self-Test and Digital Self-Calibration...

By Sleiman Bou-Sleiman and Mohammed Ismail

Edition Description

This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

Edition Details

Format:Paperback

Language:English

ISBN:1441995471

Format: Paperback

Condition:

59.29

50 Available

Quantity:

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Built-In-Self-Test and Digital Self-Calibration...

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