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Atomic Force Microscopy for Energy Research
Edition Description
Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic...
Edition Details
Format:Paperback
Language:English
ISBN:1032004118
Format: Paperback
Condition:
$
84.99
Atomic Force Microscopy for Energy Research
Edition Description
Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic...
Edition Details
Format:Hardcover
Language:English
ISBN:103200407X
Format: Hardcover
Condition:
$
249.99
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