Applying the Rasch Model and Structural Equation Modeling to Higher Education: The Technology Satisfaction Model

By A.Y.M. Atiquil Islam

This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and Structural Equation Modelling (SEM) - a multivariate technique - to higher education (HE) research. User satisfaction is traditionally measured along a single dimension.

• Format: Hardcover
• Language: English
• ISBN: 1032471409
• ISBN13: 9781032471402
• Release Date: June 2023
• Publisher: CRC Press
• Length: 140 Pages
• Weight: 0.86 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"