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Paperback Applied Computing & Information Technology Book

ISBN: 3319799487

ISBN13: 9783319799483

Applied Computing & Information Technology

Improving Relevancy Filter Methods for Cross-Project Defect Prediction.- A Game Framework Supporting Automatic Functional Testing for Games.- Feature Extraction and Cluster Analysis using n-gram Statistics for DAIHINMIN Programs.- Prediction Interval of Cumulative Number of Software Faults Using Multilayer Perceptron.- Heuristics for Daihinmin and Their Effectiveness.- Cluster Analysis for Commonalities between Words of Different Languages.-...

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