Combining technology, device design and simulation, and applications, this book is the first to deal with the design and optimization of transistors made from strained layers. Topics include background theory of the HBT, device simulation that predicts the optimum HBT device structure for a particular application, compact SiGe-HBT models for RF applications and the SPICE parameter extraction, and the enhancement of the high-frequency performance of HFETs using MOSFET or MODFET structures. The book also covers the design and application of optoelectronic devices and assesses how SiGe technology competes with other alternative technologies in the RF wireless communications marketplace.
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