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Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie
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Angewandte Oberflächenanalyse Mit Sims Sekundär... [German] 3642701787 Book Cover

Angewandte Oberflächenanalyse Mit Sims Sekundär... [German]

By , ,
Edition Description

In Anbetracht der rasch wachsenden Bedeutung der Oberfl chenanalytik schien es angebracht, die drei Methoden, welche bereits in einem sehr hohen Ma e f r die industrielle und forschungsbezogene Routineanalytik eingesetzt und h ufig mit- einander kombiniert werden, n mlich SIMS,...

Edition Details
Format:Paperback
Language:German
ISBN:3642701787
Format: Paperback
Condition:
$
79.99
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