Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)

By Richard H. Vollmerhausen and Ronald G. Driggers

Advances in solid state detector arrays, flat panel displays and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 0819434892
• ISBN13: 9780819434890
• Release Date: April 2000
• Publisher: SPIE Publications
• Length: 176 Pages
• Weight: 0.85 lbs.
• Dimensions: 9.8" x 0.5" x 7.0"