In Dynamic Random Access Memory, every cell experiences leakage current which consumes part of the stored charge. As the DRAM cell size is shrinking, the leakage is increasing. To maintain the desired... This description may be from another edition of this product.
Format:Paperback
Language:English
ISBN:3838339436
ISBN13:9783838339436
Release Date:February 2010
Publisher:Lap Lambert Academic Publishing GmbH & Company KG
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