Analysis and Characterization of the System Si Nanocluster/Siox

By Giuseppe Nicotra

This book reviews the subject of Si quantum dots embedded in dielectric andits application to the realization of non volatile semiconductor memories and optoelectronicdevices, this dialing various... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3845420316
• ISBN13: 9783845420318
• Release Date: July 2011
• Publisher: LAP Lambert Academic Publishing
• Length: 112 Pages
• Weight: 0.39 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"